An AI Framework for Microanastomosis Motion Assessment

Fuente: arXiv
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Autores principales: Meng, Yan, Torres-Rodríguez, Eduardo J., Altshuler, Marcelle, Gowda, Nishanth, Naeem, Arhum, Yilmaz, Recai, Arnaout, Omar, Donoho, Daniel A.
Formato: Preprint
Publicado: 2026
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author Meng, Yan
Torres-Rodríguez, Eduardo J.
Altshuler, Marcelle
Gowda, Nishanth
Naeem, Arhum
Yilmaz, Recai
Arnaout, Omar
Donoho, Daniel A.
author_facet Meng, Yan
Torres-Rodríguez, Eduardo J.
Altshuler, Marcelle
Gowda, Nishanth
Naeem, Arhum
Yilmaz, Recai
Arnaout, Omar
Donoho, Daniel A.
contents Proficiency in microanastomosis is a fundamental competency across multiple microsurgical disciplines. These procedures demand exceptional precision and refined technical skills, making effective, standardized assessment methods essential. Traditionally, the evaluation of microsurgical techniques has relied heavily on the subjective judgment of expert raters. They are inherently constrained by limitations such as inter-rater variability, lack of standardized evaluation criteria, susceptibility to cognitive bias, and the time-intensive nature of manual review. These shortcomings underscore the urgent need for an objective, reliable, and automated system capable of assessing microsurgical performance with consistency and scalability. To bridge this gap, we propose a novel AI framework for the automated assessment of microanastomosis instrument handling skills. The system integrates four core components: (1) an instrument detection module based on the You Only Look Once (YOLO) architecture; (2) an instrument tracking module developed from Deep Simple Online and Realtime Tracking (DeepSORT); (3) an instrument tip localization module employing shape descriptors; and (4) a supervised classification module trained on expert-labeled data to evaluate instrument handling proficiency. Experimental results demonstrate the effectiveness of the framework, achieving an instrument detection precision of 97%, with a mean Average Precision (mAP) of 96%, measured by Intersection over Union (IoU) thresholds ranging from 50% to 95% (mAP50-95).
format Preprint
id arxiv_https___arxiv_org_abs_2601_21120
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle An AI Framework for Microanastomosis Motion Assessment
Meng, Yan
Torres-Rodríguez, Eduardo J.
Altshuler, Marcelle
Gowda, Nishanth
Naeem, Arhum
Yilmaz, Recai
Arnaout, Omar
Donoho, Daniel A.
Computer Vision and Pattern Recognition
Proficiency in microanastomosis is a fundamental competency across multiple microsurgical disciplines. These procedures demand exceptional precision and refined technical skills, making effective, standardized assessment methods essential. Traditionally, the evaluation of microsurgical techniques has relied heavily on the subjective judgment of expert raters. They are inherently constrained by limitations such as inter-rater variability, lack of standardized evaluation criteria, susceptibility to cognitive bias, and the time-intensive nature of manual review. These shortcomings underscore the urgent need for an objective, reliable, and automated system capable of assessing microsurgical performance with consistency and scalability. To bridge this gap, we propose a novel AI framework for the automated assessment of microanastomosis instrument handling skills. The system integrates four core components: (1) an instrument detection module based on the You Only Look Once (YOLO) architecture; (2) an instrument tracking module developed from Deep Simple Online and Realtime Tracking (DeepSORT); (3) an instrument tip localization module employing shape descriptors; and (4) a supervised classification module trained on expert-labeled data to evaluate instrument handling proficiency. Experimental results demonstrate the effectiveness of the framework, achieving an instrument detection precision of 97%, with a mean Average Precision (mAP) of 96%, measured by Intersection over Union (IoU) thresholds ranging from 50% to 95% (mAP50-95).
title An AI Framework for Microanastomosis Motion Assessment
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2601.21120