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Main Authors: Zheng, Han, Chu, Chia-Tung, Chen, Senrui, Manes, Argyris Giannisis, Lee, Su-un, Zhou, Sisi, Jiang, Liang
Format: Preprint
Published: 2026
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Online Access:https://arxiv.org/abs/2601.22286
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author Zheng, Han
Chu, Chia-Tung
Chen, Senrui
Manes, Argyris Giannisis
Lee, Su-un
Zhou, Sisi
Jiang, Liang
author_facet Zheng, Han
Chu, Chia-Tung
Chen, Senrui
Manes, Argyris Giannisis
Lee, Su-un
Zhou, Sisi
Jiang, Liang
contents Characterizing errors in quantum circuits is essential for device calibration, yet detecting rare error events requires a large number of samples. This challenge is particularly severe in calibrating fault-tolerant, error-corrected circuits, where logical error probabilities are suppressed to higher order relative to physical noise and are therefore difficult to calibrate through direct logical measurements. Recently, Wagner et al. [PRL 130, 200601 (2023)] showed that, for phenomenological Pauli noise models, the logical channel can instead be inferred from syndrome measurement data generated during error correction. Here, we extend this framework to realistic circuit-level noise models. From a unified code-theoretic perspective and spacetime code formalism, we derive necessary and sufficient conditions for learning the logical channel from syndrome data alone and explicitly characterize the learnable degrees of freedom of circuit-level Pauli faults. Using Fourier analysis and compressed sensing, we develop efficient estimators with provable guarantees on sample complexity and computational cost. We further present an end-to-end protocol and demonstrate its performance on several syndrome-extraction circuits, achieving orders-of-magnitude sample-complexity savings over direct logical benchmarking. Our results establish syndrome-based learning as a practical approach to characterizing the logical channel in fault-tolerant quantum devices.
format Preprint
id arxiv_https___arxiv_org_abs_2601_22286
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Efficient learning of logical noise from syndrome data
Zheng, Han
Chu, Chia-Tung
Chen, Senrui
Manes, Argyris Giannisis
Lee, Su-un
Zhou, Sisi
Jiang, Liang
Quantum Physics
Mathematical Physics
Characterizing errors in quantum circuits is essential for device calibration, yet detecting rare error events requires a large number of samples. This challenge is particularly severe in calibrating fault-tolerant, error-corrected circuits, where logical error probabilities are suppressed to higher order relative to physical noise and are therefore difficult to calibrate through direct logical measurements. Recently, Wagner et al. [PRL 130, 200601 (2023)] showed that, for phenomenological Pauli noise models, the logical channel can instead be inferred from syndrome measurement data generated during error correction. Here, we extend this framework to realistic circuit-level noise models. From a unified code-theoretic perspective and spacetime code formalism, we derive necessary and sufficient conditions for learning the logical channel from syndrome data alone and explicitly characterize the learnable degrees of freedom of circuit-level Pauli faults. Using Fourier analysis and compressed sensing, we develop efficient estimators with provable guarantees on sample complexity and computational cost. We further present an end-to-end protocol and demonstrate its performance on several syndrome-extraction circuits, achieving orders-of-magnitude sample-complexity savings over direct logical benchmarking. Our results establish syndrome-based learning as a practical approach to characterizing the logical channel in fault-tolerant quantum devices.
title Efficient learning of logical noise from syndrome data
topic Quantum Physics
Mathematical Physics
url https://arxiv.org/abs/2601.22286