In-situ Straining of Epitaxial Freestanding Ferroic Films by a MEMS Device
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arXiv
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| Main Authors: | , , , , , , , , , , , , |
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| Format: | Preprint |
| Published: |
2026
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| _version_ | 1866910114639773696 |
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| author | Finizio, Simone Butcher, Tim A. Cocconcelli, Maria Müller, Elisabeth Riddiford, Lauren J. Brock, Jeffrey A. Wei, Chia-Chun Wang, Li-Shu Yang, Jan-Chi Huang, Shih-Wen Maspero, Federico Bertacco, Riccardo Raabe, Jörg |
| author_facet | Finizio, Simone Butcher, Tim A. Cocconcelli, Maria Müller, Elisabeth Riddiford, Lauren J. Brock, Jeffrey A. Wei, Chia-Chun Wang, Li-Shu Yang, Jan-Chi Huang, Shih-Wen Maspero, Federico Bertacco, Riccardo Raabe, Jörg |
| contents | Mechanical strain can be used to control physical properties in materials. The experimental investigation of strain-induced effects at the nanoscale is of importance not only for its fundamental aspects, but also for the development of device applications. Transmission X-ray microscopy is a particularly well-suited technique for nanoscale imaging of magnetic materials, but its compatibility with in-situ mechanical straining of samples is limited. In this work, we present a setup for applying tailored in-situ mechanical strains to freestanding thin films by means of a micro electromechanical system (MEMS) actuator. We then present a proof-of-concept experiment in which a freestanding 80 nm thick (001) BiFeO3 multiferroic thin film is strained with the MEMS device, allowing us to control the coupled ferroelectric/spin cycloidal configuration. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2601_23218 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | In-situ Straining of Epitaxial Freestanding Ferroic Films by a MEMS Device Finizio, Simone Butcher, Tim A. Cocconcelli, Maria Müller, Elisabeth Riddiford, Lauren J. Brock, Jeffrey A. Wei, Chia-Chun Wang, Li-Shu Yang, Jan-Chi Huang, Shih-Wen Maspero, Federico Bertacco, Riccardo Raabe, Jörg Mesoscale and Nanoscale Physics Materials Science Mechanical strain can be used to control physical properties in materials. The experimental investigation of strain-induced effects at the nanoscale is of importance not only for its fundamental aspects, but also for the development of device applications. Transmission X-ray microscopy is a particularly well-suited technique for nanoscale imaging of magnetic materials, but its compatibility with in-situ mechanical straining of samples is limited. In this work, we present a setup for applying tailored in-situ mechanical strains to freestanding thin films by means of a micro electromechanical system (MEMS) actuator. We then present a proof-of-concept experiment in which a freestanding 80 nm thick (001) BiFeO3 multiferroic thin film is strained with the MEMS device, allowing us to control the coupled ferroelectric/spin cycloidal configuration. |
| title | In-situ Straining of Epitaxial Freestanding Ferroic Films by a MEMS Device |
| topic | Mesoscale and Nanoscale Physics Materials Science |
| url | https://arxiv.org/abs/2601.23218 |