Toward Digital Twins in 3D IC Packaging: A Critical Review of Physics, Data, and Hybrid Architectures

Fuente: arXiv
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Auteurs principaux: Datta, Gourab, Sharif, Sarah Safura, Banad, Yaser Mike
Format: Preprint
Publié: 2026
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author Datta, Gourab
Sharif, Sarah Safura
Banad, Yaser Mike
author_facet Datta, Gourab
Sharif, Sarah Safura
Banad, Yaser Mike
contents Three-dimensional integrated circuit (3D IC) pack-aging and heterogeneous integration have emerged as central pillars of contemporary semiconductor scaling. Yet, the multi-physics coupling inherent to stacked architectures manifesting as thermal hot spots, warpage-induced stresses, and interconnect aging demands monitoring and control capabilities that surpass traditional offline metrology. Although Digital Twin (DT) technology provides a principled route to real-time reliability management, the existing literature remains fragmented and frequently blurs the distinction between static multiphysics simulation workflows and truly dynamic, closed-loop twins. This critical review distinguishes itself by addressing these deficiencies through three specific contributions. First, we clarify the Digital Twin hierarchy to resolve terminological ambiguity between digital models, shadows, and twins. Second, we synthesize three foundational enabling technologies: (1) physics-based modeling, emphasizing the shift from computationally intensive finite-element analysis (FEA) to real-time surrogate models; (2) data-driven paradigms, highlighting virtual metrology (VM) for inferring latent metrics; and (3) in-situ sensing, the nervous system coupling the physical stack to its virtual counterpart. Third, beyond a descriptive survey, we propose a unified hybrid DT architecture that leverages physics-informed machine learning (e.g., PINNs) to reconcile data scarcity with latency constraints. Finally, we outline a standards-aligned roadmap incorporating IEEE 1451 and UCIe protocols to accelerate the transition from passive digital shadows to autonomous, self-optimizing Digital Twins for 3D IC manufacturing and field operation.
format Preprint
id arxiv_https___arxiv_org_abs_2601_23226
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Toward Digital Twins in 3D IC Packaging: A Critical Review of Physics, Data, and Hybrid Architectures
Datta, Gourab
Sharif, Sarah Safura
Banad, Yaser Mike
Hardware Architecture
Emerging Technologies
Three-dimensional integrated circuit (3D IC) pack-aging and heterogeneous integration have emerged as central pillars of contemporary semiconductor scaling. Yet, the multi-physics coupling inherent to stacked architectures manifesting as thermal hot spots, warpage-induced stresses, and interconnect aging demands monitoring and control capabilities that surpass traditional offline metrology. Although Digital Twin (DT) technology provides a principled route to real-time reliability management, the existing literature remains fragmented and frequently blurs the distinction between static multiphysics simulation workflows and truly dynamic, closed-loop twins. This critical review distinguishes itself by addressing these deficiencies through three specific contributions. First, we clarify the Digital Twin hierarchy to resolve terminological ambiguity between digital models, shadows, and twins. Second, we synthesize three foundational enabling technologies: (1) physics-based modeling, emphasizing the shift from computationally intensive finite-element analysis (FEA) to real-time surrogate models; (2) data-driven paradigms, highlighting virtual metrology (VM) for inferring latent metrics; and (3) in-situ sensing, the nervous system coupling the physical stack to its virtual counterpart. Third, beyond a descriptive survey, we propose a unified hybrid DT architecture that leverages physics-informed machine learning (e.g., PINNs) to reconcile data scarcity with latency constraints. Finally, we outline a standards-aligned roadmap incorporating IEEE 1451 and UCIe protocols to accelerate the transition from passive digital shadows to autonomous, self-optimizing Digital Twins for 3D IC manufacturing and field operation.
title Toward Digital Twins in 3D IC Packaging: A Critical Review of Physics, Data, and Hybrid Architectures
topic Hardware Architecture
Emerging Technologies
url https://arxiv.org/abs/2601.23226