SyNeT: Synthetic Negatives for Traversability Learning

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kim, Bomena, Lee, Hojun, Park, Younsoo, Hu, Yaoyu, Scherer, Sebastian, Shim, Inwook
Format:	Preprint
Published:	2026
Subjects:	Robotics Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2602.00814