Gao, Y., Un, H., Huang, Y., Sirringhaus, H., & Jacobs, I. E. (2026). Unbounded Systematic Error in Thin Film Conductivity Measurements.
Cita Chicago Style (17a ed.)Gao, Yongyi, Hio-Ieng Un, Yuxuan Huang, Henning Sirringhaus, y Ian E. Jacobs. Unbounded Systematic Error in Thin Film Conductivity Measurements. 2026.
Cita MLA (9a ed.)Gao, Yongyi, et al. Unbounded Systematic Error in Thin Film Conductivity Measurements. 2026.
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