Explainable Computer Vision Framework for Automated Pore Detection and Criticality Assessment in Additive Manufacturing
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arXiv
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| Hauptverfasser: | , |
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| Format: | Preprint |
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2026
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| _version_ | 1866911420590850048 |
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| author | Mishra, Akshansh Morisetty, Rakesh |
| author_facet | Mishra, Akshansh Morisetty, Rakesh |
| contents | Internal porosity remains a critical defect mode in additively manufactured components, compromising structural performance and limiting industrial adoption. Automated defect detection methods exist but lack interpretability, preventing engineers from understanding the physical basis of criticality predictions. This study presents an explainable computer vision framework for pore detection and criticality assessment in three-dimensional tomographic volumes. Sequential grayscale slices were reconstructed into volumetric datasets, and intensity-based thresholding with connected component analysis identified 500 individual pores. Each pore was characterized using geometric descriptors including size, aspect ratio, extent, and spatial position relative to the specimen boundary. A pore interaction network was constructed using percentile-based Euclidean distance criteria, yielding 24,950 inter-pore connections. Machine learning models predicted pore criticality scores from extracted features, and SHAP analysis quantified individual feature contributions. Results demonstrate that normalized surface distance dominates model predictions, contributing more than an order of magnitude greater importance than all other descriptors. Pore size provides minimal influence, while geometric parameters show negligible impact. The strong inverse relationship between surface proximity and criticality reveals boundary-driven failure mechanisms. This interpretable framework enables transparent defect assessment and provides actionable insights for process optimization and quality control in additive manufacturing. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2602_03883 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Explainable Computer Vision Framework for Automated Pore Detection and Criticality Assessment in Additive Manufacturing Mishra, Akshansh Morisetty, Rakesh Computer Vision and Pattern Recognition Artificial Intelligence Computational Engineering, Finance, and Science Machine Learning Internal porosity remains a critical defect mode in additively manufactured components, compromising structural performance and limiting industrial adoption. Automated defect detection methods exist but lack interpretability, preventing engineers from understanding the physical basis of criticality predictions. This study presents an explainable computer vision framework for pore detection and criticality assessment in three-dimensional tomographic volumes. Sequential grayscale slices were reconstructed into volumetric datasets, and intensity-based thresholding with connected component analysis identified 500 individual pores. Each pore was characterized using geometric descriptors including size, aspect ratio, extent, and spatial position relative to the specimen boundary. A pore interaction network was constructed using percentile-based Euclidean distance criteria, yielding 24,950 inter-pore connections. Machine learning models predicted pore criticality scores from extracted features, and SHAP analysis quantified individual feature contributions. Results demonstrate that normalized surface distance dominates model predictions, contributing more than an order of magnitude greater importance than all other descriptors. Pore size provides minimal influence, while geometric parameters show negligible impact. The strong inverse relationship between surface proximity and criticality reveals boundary-driven failure mechanisms. This interpretable framework enables transparent defect assessment and provides actionable insights for process optimization and quality control in additive manufacturing. |
| title | Explainable Computer Vision Framework for Automated Pore Detection and Criticality Assessment in Additive Manufacturing |
| topic | Computer Vision and Pattern Recognition Artificial Intelligence Computational Engineering, Finance, and Science Machine Learning |
| url | https://arxiv.org/abs/2602.03883 |