Robust Nonparametric Two-Sample Tests via Mutual Information using Extended Bregman Divergence

Fuente: arXiv
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Autor principal: Pyne, Arijit
Formato: Preprint
Publicado: 2026
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author Pyne, Arijit
author_facet Pyne, Arijit
contents We introduce a generalized formulation of mutual information (MI) based on the extended Bregman divergence, a framework that subsumes the generalized S-Bregman (GSB) divergence family. The GSB divergence unifies two important classes of statistical distances, namely the S-divergence and the Bregman exponential divergence (BED), thereby encompassing several widely used subfamilies, including the power divergence (PD), density power divergence (DPD), and S-Hellinger distance (S-HD). In parametric inference, minimum divergence estimators are well known to balance robustness with high asymptotic efficiency relative to the maximum likelihood estimator. However, nonparametric tests based on such statistical distances have been relatively less explored. In this paper, we construct a class of consistent and robust nonparametric two-sample tests for the equality of two absolutely continuous distributions using the generalized MI. We establish the asymptotic normality of the proposed test statistics under the null and contiguous alternatives. The robustness properties of the generalized MI are rigorously studied through the influence function and the breakdown point, demonstrating that stability of the generalized MI translates into stability of the associated tests. Extensive simulation studies show that divergences beyond the PD family often yield superior robustness under contamination while retaining high asymptotic power. A data-driven scheme for selecting optimal tuning parameters is also proposed. Finally, the methodology is illustrated with applications to real data.
format Preprint
id arxiv_https___arxiv_org_abs_2602_04010
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Robust Nonparametric Two-Sample Tests via Mutual Information using Extended Bregman Divergence
Pyne, Arijit
Methodology
62G10, 62G35, 62G20, 62B10 (Primary)
We introduce a generalized formulation of mutual information (MI) based on the extended Bregman divergence, a framework that subsumes the generalized S-Bregman (GSB) divergence family. The GSB divergence unifies two important classes of statistical distances, namely the S-divergence and the Bregman exponential divergence (BED), thereby encompassing several widely used subfamilies, including the power divergence (PD), density power divergence (DPD), and S-Hellinger distance (S-HD). In parametric inference, minimum divergence estimators are well known to balance robustness with high asymptotic efficiency relative to the maximum likelihood estimator. However, nonparametric tests based on such statistical distances have been relatively less explored. In this paper, we construct a class of consistent and robust nonparametric two-sample tests for the equality of two absolutely continuous distributions using the generalized MI. We establish the asymptotic normality of the proposed test statistics under the null and contiguous alternatives. The robustness properties of the generalized MI are rigorously studied through the influence function and the breakdown point, demonstrating that stability of the generalized MI translates into stability of the associated tests. Extensive simulation studies show that divergences beyond the PD family often yield superior robustness under contamination while retaining high asymptotic power. A data-driven scheme for selecting optimal tuning parameters is also proposed. Finally, the methodology is illustrated with applications to real data.
title Robust Nonparametric Two-Sample Tests via Mutual Information using Extended Bregman Divergence
topic Methodology
62G10, 62G35, 62G20, 62B10 (Primary)
url https://arxiv.org/abs/2602.04010