Epitaxial growth optimization, measurement and theoretical analysis of strain-compensated QCL grown on (511)A InP

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Autori principali: Cargioli, Alessio, Beck, Mattias, Faist, Jerome
Natura: Preprint
Pubblicazione: 2026
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author Cargioli, Alessio
Beck, Mattias
Faist, Jerome
author_facet Cargioli, Alessio
Beck, Mattias
Faist, Jerome
contents Interface roughness scattering is an important limiting factor for achieving high performance Quantum Cascade Lasers. Following recent results, we study the growth conditions for a strain-compensated QCL emitting around 4.6 μm grown on a (511)A InP substrate using AFM and XRD measurements. We find that modulating the arsenic flux and correctly tailoring the III/V ratio is fundamental to achieve a good quality material. We report the first lasing device on such a platform with a current density threshold of 1.34 kA/cm2 and a slope efficiency of 1.1 W/A, which result suboptimal compared to the (100) reference. Finally, we find a 7% redshift of the (511)A spectrum which we attribute to an impurity scattering due to the increased incorporation along the exposed (111) direction. We validate this statement by verifying that the change in CBO and effective electron mass due to strain along a non-trivial direction cannot cause such a shift by using the k-p method generalized to arbitrary growth directions
format Preprint
id arxiv_https___arxiv_org_abs_2602_04874
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Epitaxial growth optimization, measurement and theoretical analysis of strain-compensated QCL grown on (511)A InP
Cargioli, Alessio
Beck, Mattias
Faist, Jerome
Applied Physics
Interface roughness scattering is an important limiting factor for achieving high performance Quantum Cascade Lasers. Following recent results, we study the growth conditions for a strain-compensated QCL emitting around 4.6 μm grown on a (511)A InP substrate using AFM and XRD measurements. We find that modulating the arsenic flux and correctly tailoring the III/V ratio is fundamental to achieve a good quality material. We report the first lasing device on such a platform with a current density threshold of 1.34 kA/cm2 and a slope efficiency of 1.1 W/A, which result suboptimal compared to the (100) reference. Finally, we find a 7% redshift of the (511)A spectrum which we attribute to an impurity scattering due to the increased incorporation along the exposed (111) direction. We validate this statement by verifying that the change in CBO and effective electron mass due to strain along a non-trivial direction cannot cause such a shift by using the k-p method generalized to arbitrary growth directions
title Epitaxial growth optimization, measurement and theoretical analysis of strain-compensated QCL grown on (511)A InP
topic Applied Physics
url https://arxiv.org/abs/2602.04874