Chen, S., Gong, W., & Zhou, S. (2026). Instance-optimal high-precision shadow tomography with few-copy measurements: A metrological approach.
Chicago Style (17th ed.) CitationChen, Senrui, Weiyuan Gong, and Sisi Zhou. Instance-optimal High-precision Shadow Tomography with Few-copy Measurements: A Metrological Approach. 2026.
MLA (9th ed.) CitationChen, Senrui, et al. Instance-optimal High-precision Shadow Tomography with Few-copy Measurements: A Metrological Approach. 2026.
Warning: These citations may not always be 100% accurate.