Jacobs-Gedrim, R., Wahby, W., Awe, T., Xiao, P., Witten, M., Martinez-Marez, J., . . . Agarwal, S. (2026). Strong radial electric field scaling near nanoscale conductive filaments and the ReRAM resistive switching mechanism.
Chicago Style (17th ed.) CitationJacobs-Gedrim, Robin, et al. Strong Radial Electric Field Scaling Near Nanoscale Conductive Filaments and the ReRAM Resistive Switching Mechanism. 2026.
MLA (9th ed.) CitationJacobs-Gedrim, Robin, et al. Strong Radial Electric Field Scaling Near Nanoscale Conductive Filaments and the ReRAM Resistive Switching Mechanism. 2026.
Warning: These citations may not always be 100% accurate.