Entanglement-enhanced quantum metrology via alternating in-phase and quadrature modulation

Fuente: arXiv
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Autores principales: Ma, Jihao, Huang, Jiahao, Lee, Chaohong
Formato: Preprint
Publicado: 2026
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author Ma, Jihao
Huang, Jiahao
Lee, Chaohong
author_facet Ma, Jihao
Huang, Jiahao
Lee, Chaohong
contents Quantum metrology harnesses quantum entanglement to improve measurement precision beyond standard quantum limit. Although nonlinear interaction is essential for generating entanglement, during signal accumulation, it becomes detrimental and therefore must be suppressed. To address this challenge, we propose an alternating in-phase and quadrature modulation (AIQM) scheme, designed to operate under a fixed nonlinear interaction. During signal accumulation, our time-interleaved approach sequentially applies the in-phase and quadrature driving fields, thereby eliminating the effects of nonlinear interaction on signal accumulation. Our AIQM scheme achieves better metrological performance than conventional schemes, particularly under strong nonlinear interaction and prolonged signal accumulation, with pronounced robustness against parameter variations. By selectively eliminating and utilizing nonlinear interactions via AIQM, our work enables high-precision and high-accuracy entanglement-enhanced sensing without the need for active control of the nonlinear interaction.
format Preprint
id arxiv_https___arxiv_org_abs_2602_05337
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Entanglement-enhanced quantum metrology via alternating in-phase and quadrature modulation
Ma, Jihao
Huang, Jiahao
Lee, Chaohong
Quantum Physics
Atomic Physics
Quantum metrology harnesses quantum entanglement to improve measurement precision beyond standard quantum limit. Although nonlinear interaction is essential for generating entanglement, during signal accumulation, it becomes detrimental and therefore must be suppressed. To address this challenge, we propose an alternating in-phase and quadrature modulation (AIQM) scheme, designed to operate under a fixed nonlinear interaction. During signal accumulation, our time-interleaved approach sequentially applies the in-phase and quadrature driving fields, thereby eliminating the effects of nonlinear interaction on signal accumulation. Our AIQM scheme achieves better metrological performance than conventional schemes, particularly under strong nonlinear interaction and prolonged signal accumulation, with pronounced robustness against parameter variations. By selectively eliminating and utilizing nonlinear interactions via AIQM, our work enables high-precision and high-accuracy entanglement-enhanced sensing without the need for active control of the nonlinear interaction.
title Entanglement-enhanced quantum metrology via alternating in-phase and quadrature modulation
topic Quantum Physics
Atomic Physics
url https://arxiv.org/abs/2602.05337