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Crystallinity Evolution of MOCVD-Grown $β$-Ga$_2$O$_3$ Films Probed by In Situ HT-XRD under Different Reactor Heights

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Rahaman, Imteaz, Li, Botong, Duersch, Bobby G., Ellis, Hunter D., Anderson, Kathy, Fu, Kai
Formato:	Preprint
Publicado:	2026
Materias:	Materials Science
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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