Temperature dependence of electronic conductivity from ab initio thermal simulation

Fuente: arXiv
Salvato in:
Dettagli Bibliografici
Autori principali: Hussein, Ridwan, Ugwumadu, Chinonso, Nepal, Kishor, Tutchton, Roxanne M., Kappagantula, Keerti, Drabold, David Alan
Natura: Preprint
Pubblicazione: 2026
Soggetti:
Accesso online:
Tags: Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne!!
_version_ 1866913054247092224
author Hussein, Ridwan
Ugwumadu, Chinonso
Nepal, Kishor
Tutchton, Roxanne M.
Kappagantula, Keerti
Drabold, David Alan
author_facet Hussein, Ridwan
Ugwumadu, Chinonso
Nepal, Kishor
Tutchton, Roxanne M.
Kappagantula, Keerti
Drabold, David Alan
contents We present a temperature-dependent extension of the approximate electronic conductivity formula of Hindley and Mott that leverages time-averaged fluctuations of the electronic density of states obtained from ab initio molecular dynamics. By thermally averaging the square of the density of states near the Fermi level, we obtain an estimate of the temperature dependence of the conductivity. This approach termed the thermally-averaged Hindley-Mott (TAHM) method was applied to five representative systems: crystalline aluminum (c-Al), aluminum with a grain boundary (AlGB), a four-layer graphene-aluminum composite (Al-Gr), amorphous silicon (a-Si) and amorphous germanium-antimony-telluride (a-GST). The method reproduces the expected Bloch-Gruneisen decrease in conductivity for c-Al and AlGB. Generally, the reduction (increase) in conductivity for metallic (semiconducting) materials are reproduced. It captures microstructure-induced, thermally activated conduction in multilayer Al-Gr, a-Si and a-GST. Overall, the approach provides a computationally efficient link between time-dependent electronic structure and temperature-dependent transport, offering a simple and approximate tool for exploring electronic conductivity trends in complex and disordered materials.
format Preprint
id arxiv_https___arxiv_org_abs_2602_06076
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Temperature dependence of electronic conductivity from ab initio thermal simulation
Hussein, Ridwan
Ugwumadu, Chinonso
Nepal, Kishor
Tutchton, Roxanne M.
Kappagantula, Keerti
Drabold, David Alan
Materials Science
We present a temperature-dependent extension of the approximate electronic conductivity formula of Hindley and Mott that leverages time-averaged fluctuations of the electronic density of states obtained from ab initio molecular dynamics. By thermally averaging the square of the density of states near the Fermi level, we obtain an estimate of the temperature dependence of the conductivity. This approach termed the thermally-averaged Hindley-Mott (TAHM) method was applied to five representative systems: crystalline aluminum (c-Al), aluminum with a grain boundary (AlGB), a four-layer graphene-aluminum composite (Al-Gr), amorphous silicon (a-Si) and amorphous germanium-antimony-telluride (a-GST). The method reproduces the expected Bloch-Gruneisen decrease in conductivity for c-Al and AlGB. Generally, the reduction (increase) in conductivity for metallic (semiconducting) materials are reproduced. It captures microstructure-induced, thermally activated conduction in multilayer Al-Gr, a-Si and a-GST. Overall, the approach provides a computationally efficient link between time-dependent electronic structure and temperature-dependent transport, offering a simple and approximate tool for exploring electronic conductivity trends in complex and disordered materials.
title Temperature dependence of electronic conductivity from ab initio thermal simulation
topic Materials Science
url https://arxiv.org/abs/2602.06076