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Shallow Trap States Control Electrical Performance of Amorphous Oxide Semiconductor Thin-Film Transistors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Mattsson, Måns J., Lee, Jinhan, Malmberg, Christopher E., Parker, Jared, Vogt, Kyle T., Kim, Hyemi, Hong, Minji, Yun, Pilsang, Ha, Daewon, Lee, Taeyoon, Cheong, Paul H. -Y., Wager, John F., Graham, Matt W.
Format:	Preprint
Published:	2026
Subjects:	Applied Physics Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
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