Damage accumulation induced metal-insulator transition through ion implantation of ScN thin films

Fuente: arXiv

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Bibliographic Details
Main Authors:	Poterie, Charlotte, Marteau, Marc, Eklund, Per, Cabioch, Thierry, Barbot, Jean-Francois, Febvrier, Arnaud le
Format:	Preprint
Published:	2026
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2602.06757