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Damage accumulation induced metal-insulator transition through ion implantation of ScN thin films

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Poterie, Charlotte, Marteau, Marc, Eklund, Per, Cabioch, Thierry, Barbot, Jean-Francois, Febvrier, Arnaud le
Natura:	Preprint
Pubblicazione:	2026
Soggetti:	Materials Science
Accesso online:	Acceder al recurso
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