TamperBench: Systematically Stress-Testing LLM Safety Under Fine-Tuning and Tampering

Fuente: arXiv

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Bibliographic Details
Main Authors:	Hossain, Saad, Tseng, Tom, Pandey, Punya Syon, Vajpayee, Samanvay, Kowal, Matthew, Nonta, Nayeema, Simko, Samuel, Casper, Stephen, Jin, Zhijing, Pelrine, Kellin, Rambhatla, Sirisha
Format:	Preprint
Published:	2026
Subjects:	Cryptography and Security Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2602.06911