Saved in:
| Main Authors: | , , , , , |
|---|---|
| Format: | Preprint |
| Published: |
2026
|
| Subjects: | |
| Online Access: | https://arxiv.org/abs/2602.07657 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1866911431356579840 |
|---|---|
| author | Ahmad, Redwan Simard, Charles Sebastian, Rejeena R Lafreniere-Greig, Jonathan Ropagnol, Xavier Blanchard, Francois |
| author_facet | Ahmad, Redwan Simard, Charles Sebastian, Rejeena R Lafreniere-Greig, Jonathan Ropagnol, Xavier Blanchard, Francois |
| contents | A compact terahertz (THz) polarimetric spectrometer and imaging system is demonstrated using polarization-sensitive frequency-selective surfaces (PS-FSS) and rapid, intensity-based detection. Real-time Stokes parameter extraction enables angle-of-linear-polarization (AoLP) measurements and quantitative retrieval of the birefringence of a 1-mm-thick x-cut quartz crystal, used here as a benchmark anisotropic sample. The extracted birefringence is in good agreement with THz time domain spectroscopy-based measurements, validating the accuracy of the proposed THz polarimetric approach. Signal-to-noise ratios (SNR) up to 87 dB across 0.23-0.41 THz ensure reliable discrimination of the measured spectral components above the noise floor. Extending this approach to raster-scanned THz imaging using distinct PS-FSS orientations (0°, 45°, 90°, and 135°) enables simultaneous mapping of frequency-dependent Stokes parameters. The resulting degree of linear polarization (DoLP) and AoLP maps exhibit well-resolved polarimetric contrast, consistent with numerical simulations and independent visible polarimetric measurements. Operating entirely without field-resolved detection or mechanical delay stages, the system provides a robust and compact platform for THz polarimetric spectroscopy and imaging of anisotropic materials. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2602_07657 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Terahertz multispectral polarimetric imaging based on intensity measurement Ahmad, Redwan Simard, Charles Sebastian, Rejeena R Lafreniere-Greig, Jonathan Ropagnol, Xavier Blanchard, Francois Optics A compact terahertz (THz) polarimetric spectrometer and imaging system is demonstrated using polarization-sensitive frequency-selective surfaces (PS-FSS) and rapid, intensity-based detection. Real-time Stokes parameter extraction enables angle-of-linear-polarization (AoLP) measurements and quantitative retrieval of the birefringence of a 1-mm-thick x-cut quartz crystal, used here as a benchmark anisotropic sample. The extracted birefringence is in good agreement with THz time domain spectroscopy-based measurements, validating the accuracy of the proposed THz polarimetric approach. Signal-to-noise ratios (SNR) up to 87 dB across 0.23-0.41 THz ensure reliable discrimination of the measured spectral components above the noise floor. Extending this approach to raster-scanned THz imaging using distinct PS-FSS orientations (0°, 45°, 90°, and 135°) enables simultaneous mapping of frequency-dependent Stokes parameters. The resulting degree of linear polarization (DoLP) and AoLP maps exhibit well-resolved polarimetric contrast, consistent with numerical simulations and independent visible polarimetric measurements. Operating entirely without field-resolved detection or mechanical delay stages, the system provides a robust and compact platform for THz polarimetric spectroscopy and imaging of anisotropic materials. |
| title | Terahertz multispectral polarimetric imaging based on intensity measurement |
| topic | Optics |
| url | https://arxiv.org/abs/2602.07657 |