Systematic Analysis of Ferroelectric Domain Dynamics in Periodically Poled Lithium Niobate Waveguides Using Two-Photon Microscopy and Digital Imaging Processing
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arXiv
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| Auteurs principaux: | , , , , , , , , , , |
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| Format: | Preprint |
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2026
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| _version_ | 1866915784435957760 |
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| author | Zhang, Jiuyi Cullen, Christopher Konkol, Matthew Yao, Peng Creazzo, Timothy Murakowski, Janusz Xue, Ruidong Zhu, Xiaofeng Rasel, Md Omar Faruk Kabra, Yash Prather, Dennis |
| author_facet | Zhang, Jiuyi Cullen, Christopher Konkol, Matthew Yao, Peng Creazzo, Timothy Murakowski, Janusz Xue, Ruidong Zhu, Xiaofeng Rasel, Md Omar Faruk Kabra, Yash Prather, Dennis |
| contents | We present a characterization and analysis methodology suitable for volume production for characterizing and optimizing x-cut thin-film periodically poled lithium niobate (PPLN) devices using two-photon (2P) microscopy with quantitative image processing. This method enables direct extraction of key structural parameters, such as duty cycle, phase-matching behavior, and domain uniformity, across large device sets in a non-destructive manner. By correlating 2P microscopy-derived structural metrics with systematic variations in poling conditions, we establish a scalable, image-driven approach for evaluating and improving PPLN fabrication. The resulting workflow supports wafer-level process development and accelerates the manufacturing and packaging of lithium niobate photonic integrated circuits (PICs). |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2602_07792 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Systematic Analysis of Ferroelectric Domain Dynamics in Periodically Poled Lithium Niobate Waveguides Using Two-Photon Microscopy and Digital Imaging Processing Zhang, Jiuyi Cullen, Christopher Konkol, Matthew Yao, Peng Creazzo, Timothy Murakowski, Janusz Xue, Ruidong Zhu, Xiaofeng Rasel, Md Omar Faruk Kabra, Yash Prather, Dennis Optics We present a characterization and analysis methodology suitable for volume production for characterizing and optimizing x-cut thin-film periodically poled lithium niobate (PPLN) devices using two-photon (2P) microscopy with quantitative image processing. This method enables direct extraction of key structural parameters, such as duty cycle, phase-matching behavior, and domain uniformity, across large device sets in a non-destructive manner. By correlating 2P microscopy-derived structural metrics with systematic variations in poling conditions, we establish a scalable, image-driven approach for evaluating and improving PPLN fabrication. The resulting workflow supports wafer-level process development and accelerates the manufacturing and packaging of lithium niobate photonic integrated circuits (PICs). |
| title | Systematic Analysis of Ferroelectric Domain Dynamics in Periodically Poled Lithium Niobate Waveguides Using Two-Photon Microscopy and Digital Imaging Processing |
| topic | Optics |
| url | https://arxiv.org/abs/2602.07792 |