Meissner-Ochsenfeld effect in semiconductor nanostructures with negative-U shells

Fuente: arXiv
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Autori principali: Bagraev, N. T., Dovator, N. A., Klyachkin, L. E., Malyarenko, A. M.
Natura: Preprint
Pubblicazione: 2026
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author Bagraev, N. T.
Dovator, N. A.
Klyachkin, L. E.
Malyarenko, A. M.
author_facet Bagraev, N. T.
Dovator, N. A.
Klyachkin, L. E.
Malyarenko, A. M.
contents The Meissner-Ochsenfeld effect is demonstrated for the first time at room temperature. The diamagnetic response of a silicon nanostructure with edge channels covered by chains of negative U dipole boron centers is studied when put in (removed from) an external magnetic field. Measurements of the diamagnetic response were carried out by recording the values of magnetization and generation currents. There is good agreement between the results of measurements of the generated internal magnetic field obtained using a ferroprobe and recording the EMF induced by the occurrence of generation currents in an external magnetic field, which determines the conditions of the mechanism of the nondissipative transport in the edge channels at room temperature, which is caused by their interactions with single carriers through negative U dipole boron centers. The interrelation of the magnetization hysteresis and the magnitude of the EMF induced by the occurrence of generation currents indicates the possibilities of the electrical registration of the Meissner-Ochsenfeld effect in nanostructures manufactured within the framework of the Hall geometry.
format Preprint
id arxiv_https___arxiv_org_abs_2602_09068
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Meissner-Ochsenfeld effect in semiconductor nanostructures with negative-U shells
Bagraev, N. T.
Dovator, N. A.
Klyachkin, L. E.
Malyarenko, A. M.
Mesoscale and Nanoscale Physics
The Meissner-Ochsenfeld effect is demonstrated for the first time at room temperature. The diamagnetic response of a silicon nanostructure with edge channels covered by chains of negative U dipole boron centers is studied when put in (removed from) an external magnetic field. Measurements of the diamagnetic response were carried out by recording the values of magnetization and generation currents. There is good agreement between the results of measurements of the generated internal magnetic field obtained using a ferroprobe and recording the EMF induced by the occurrence of generation currents in an external magnetic field, which determines the conditions of the mechanism of the nondissipative transport in the edge channels at room temperature, which is caused by their interactions with single carriers through negative U dipole boron centers. The interrelation of the magnetization hysteresis and the magnitude of the EMF induced by the occurrence of generation currents indicates the possibilities of the electrical registration of the Meissner-Ochsenfeld effect in nanostructures manufactured within the framework of the Hall geometry.
title Meissner-Ochsenfeld effect in semiconductor nanostructures with negative-U shells
topic Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2602.09068