Citazione Stile APA (7a Edizione)

Burgess, J., Abdal, R., Stoddart, D., Tulyakov, S., Yeung-Levy, S., & Wang, K. J. (2026). ArtifactLens: Hundreds of Labels Are Enough for Artifact Detection with VLMs.

Citazione stile Chigago Style (17a edizione)

Burgess, James, Rameen Abdal, Dan Stoddart, Sergey Tulyakov, Serena Yeung-Levy, e Kuan-Chieh Jackson Wang. ArtifactLens: Hundreds of Labels Are Enough for Artifact Detection with VLMs. 2026.

Citatione MLA (9a ed.)

Burgess, James, et al. ArtifactLens: Hundreds of Labels Are Enough for Artifact Detection with VLMs. 2026.