ArtifactLens: Hundreds of Labels Are Enough for Artifact Detection with VLMs

Fuente: arXiv
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Bibliographic Details
Main Authors: Burgess, James, Abdal, Rameen, Stoddart, Dan, Tulyakov, Sergey, Yeung-Levy, Serena, Wang, Kuan-Chieh Jackson
Format: Preprint
Published: 2026
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