Why Does RL Generalize Better Than SFT? A Data-Centric Perspective on VLM Post-Training

Fuente: arXiv

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Bibliographic Details
Main Authors:	Lu, Aojun, Feng, Tao, Yuan, Hangjie, Li, Wei, Sun, Yanan
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2602.10815