Structural control of two-level defect density revealed by high-throughput correlative measurements of Josephson junctions

Fuente: arXiv
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Bibliographic Details
Main Authors: Wolff, Oliver F., Mantry, Harshvardhan, Raja, Rahim, Peng, Wei-Hsiang, Singirikonda, Kaushik, Lee, Seungkyun, Sudhaman, Shishir, Goncalves, Rafael, Huang, Pinshane Y., Kou, Angela, Pfaff, Wolfgang
Format: Preprint
Published: 2026
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