Device-Circuit Co-Design of Variation-Resilient Read and Write Drivers for Antiferromagnetic Tunnel Junction (AFMTJ) Memories

Fuente: arXiv

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Bibliographic Details
Main Authors:	Choudhary, Yousuf, Adegbija, Tosiron
Format:	Preprint
Published:	2026
Subjects:	Hardware Architecture Emerging Technologies
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2602.11614