A Transformer-based Model for Rapid Microstructure Inference from Four-Dimensional Scanning Transmission Electron Microscopy Data

Fuente: arXiv

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Bibliographic Details
Main Authors:	Je, Kwanghwi, Kennedy, Ellis R., Kim, Sungin, Yang, Yao, Thiede, Erik H.
Format:	Preprint
Published:	2026
Subjects:	Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2602.12420