Meyer, T., Flathmann, C., Ehrlich, D. A., Paap-Peretzki, P., Lindner, J., Jooß, C., & Seibt, M. (2026). Quantitative models for excess carrier diffusion and recombination in STEM-EBIC experiments on semiconductor nanostructures.
Citazione stile Chigago Style (17a edizione)Meyer, Tobias, Christoph Flathmann, David A. Ehrlich, Patrick Paap-Peretzki, Jonas Lindner, Christian Jooß, e Michael Seibt. Quantitative Models for Excess Carrier Diffusion and Recombination in STEM-EBIC Experiments on Semiconductor Nanostructures. 2026.
Citatione MLA (9a ed.)Meyer, Tobias, et al. Quantitative Models for Excess Carrier Diffusion and Recombination in STEM-EBIC Experiments on Semiconductor Nanostructures. 2026.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.