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Quantitative models for excess carrier diffusion and recombination in STEM-EBIC experiments on semiconductor nanostructures

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Meyer, Tobias, Flathmann, Christoph, Ehrlich, David A., Paap-Peretzki, Patrick, Lindner, Jonas, Jooß, Christian, Seibt, Michael
Formato:	Preprint
Publicado:	2026
Materias:	Mesoscale and Nanoscale Physics Materials Science Applied Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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