Cover Image

Quantitative models for excess carrier diffusion and recombination in STEM-EBIC experiments on semiconductor nanostructures

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Meyer, Tobias, Flathmann, Christoph, Ehrlich, David A., Paap-Peretzki, Patrick, Lindner, Jonas, Jooß, Christian, Seibt, Michael
Format: Preprint
Published: 2026
Subjects:
Mesoscale and Nanoscale Physics
Materials Science
Applied Physics
Online Access:
Acceder al recurso
Tags: Add Tag
No Tags, Be the first to tag this record!
Be the first to leave a comment!
You must be logged in first

Similar Items