Convergent-Beam X-ray Crystallography

Fuente: arXiv
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Main Authors: Li, Chufeng, Zakharova, Margarita, Prasciolu, Mauro, Wong, Jia Chyi, Fleckenstein, Holger, Ivanov, Nikolay, Zhang, Wenhui, Butola, Mansi, Dresselhaus, J. Lukas, Aquino, Ivan De Gennaro, Egorov, Dmitry, Middendorf, Philipp, Henkel, Alessa, Klopprogge, Bjarne, Klemeyer, Lars, Beck, Tobias, Yefanov, Oleksandr, Barthelmess, Miriam, Sprenger, Janina, Oberthuer, Dominik, Bajt, Saša, Chapman, Henry N.
Format: Preprint
Published: 2026
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author Li, Chufeng
Zakharova, Margarita
Prasciolu, Mauro
Wong, Jia Chyi
Fleckenstein, Holger
Ivanov, Nikolay
Zhang, Wenhui
Butola, Mansi
Dresselhaus, J. Lukas
Aquino, Ivan De Gennaro
Egorov, Dmitry
Middendorf, Philipp
Henkel, Alessa
Klopprogge, Bjarne
Klemeyer, Lars
Beck, Tobias
Yefanov, Oleksandr
Barthelmess, Miriam
Sprenger, Janina
Oberthuer, Dominik
Bajt, Saša
Chapman, Henry N.
author_facet Li, Chufeng
Zakharova, Margarita
Prasciolu, Mauro
Wong, Jia Chyi
Fleckenstein, Holger
Ivanov, Nikolay
Zhang, Wenhui
Butola, Mansi
Dresselhaus, J. Lukas
Aquino, Ivan De Gennaro
Egorov, Dmitry
Middendorf, Philipp
Henkel, Alessa
Klopprogge, Bjarne
Klemeyer, Lars
Beck, Tobias
Yefanov, Oleksandr
Barthelmess, Miriam
Sprenger, Janina
Oberthuer, Dominik
Bajt, Saša
Chapman, Henry N.
contents Molecular and polymeric crystals show a wide range of functional properties that arise from the interplay between the atomic-scale structure of their constituent molecules and the organization of these molecules within the crystal lattice at macroscopic length scales. X-ray diffraction can provide structural information at these disparate length scales, but usually only through experiments that address one or the other of molecular (or unit-cell) structure versus crystal structure. Consequently, the accuracy of determined molecular or polymer structures may be limited by unaccounted crystal inhomogeneities of the crystal lattice and the characterization of crystalline materials might not reveal the underlying causes of crystal morphology. Here we introduce X-ray convergent-beam diffraction to obtain spatially-resolved structural information from crystals by projection topographic imaging. Using highly focusing X-ray multilayer Laue lenses, we show that Bragg reflections can be mapped into tomographic images of the crystal, for the characterization of strain and defects at high resolution. We demonstrate how the crystal morphology obtained this way can be accounted for when determining structure factors as a function of position in the crystal. The approach may assist in studies such as diffusion and binding in MOFS, protein-drug binding, crystal growth, and the mechanical responses of photo-reactive or thermally driven dynamic crystals.
format Preprint
id arxiv_https___arxiv_org_abs_2602_14402
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Convergent-Beam X-ray Crystallography
Li, Chufeng
Zakharova, Margarita
Prasciolu, Mauro
Wong, Jia Chyi
Fleckenstein, Holger
Ivanov, Nikolay
Zhang, Wenhui
Butola, Mansi
Dresselhaus, J. Lukas
Aquino, Ivan De Gennaro
Egorov, Dmitry
Middendorf, Philipp
Henkel, Alessa
Klopprogge, Bjarne
Klemeyer, Lars
Beck, Tobias
Yefanov, Oleksandr
Barthelmess, Miriam
Sprenger, Janina
Oberthuer, Dominik
Bajt, Saša
Chapman, Henry N.
Materials Science
Applied Physics
Biological Physics
Optics
Molecular and polymeric crystals show a wide range of functional properties that arise from the interplay between the atomic-scale structure of their constituent molecules and the organization of these molecules within the crystal lattice at macroscopic length scales. X-ray diffraction can provide structural information at these disparate length scales, but usually only through experiments that address one or the other of molecular (or unit-cell) structure versus crystal structure. Consequently, the accuracy of determined molecular or polymer structures may be limited by unaccounted crystal inhomogeneities of the crystal lattice and the characterization of crystalline materials might not reveal the underlying causes of crystal morphology. Here we introduce X-ray convergent-beam diffraction to obtain spatially-resolved structural information from crystals by projection topographic imaging. Using highly focusing X-ray multilayer Laue lenses, we show that Bragg reflections can be mapped into tomographic images of the crystal, for the characterization of strain and defects at high resolution. We demonstrate how the crystal morphology obtained this way can be accounted for when determining structure factors as a function of position in the crystal. The approach may assist in studies such as diffusion and binding in MOFS, protein-drug binding, crystal growth, and the mechanical responses of photo-reactive or thermally driven dynamic crystals.
title Convergent-Beam X-ray Crystallography
topic Materials Science
Applied Physics
Biological Physics
Optics
url https://arxiv.org/abs/2602.14402