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Main Authors: Luomahaara, Juho, Razas, Kristupas, Sedeh, Omid Sharifi, Loreto, Renan P., Lehtinen, Janne S., Xu, Mingchi, Cotten, Armel A., Tarascio, Aldo, Müller, Peter, Yurttagül, Nikolai, Lehtisyrjä, Lassi, Grönberg, Leif, Scheller, Christian P., Prance, Jonathan R., Thompson, Michael D., Haley, Richard P., Prunnila, Mika, Zumbühl, Dominik M.
Format: Preprint
Published: 2026
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Online Access:https://arxiv.org/abs/2602.14637
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author Luomahaara, Juho
Razas, Kristupas
Sedeh, Omid Sharifi
Loreto, Renan P.
Lehtinen, Janne S.
Xu, Mingchi
Cotten, Armel A.
Tarascio, Aldo
Müller, Peter
Yurttagül, Nikolai
Lehtisyrjä, Lassi
Grönberg, Leif
Scheller, Christian P.
Prance, Jonathan R.
Thompson, Michael D.
Haley, Richard P.
Prunnila, Mika
Zumbühl, Dominik M.
author_facet Luomahaara, Juho
Razas, Kristupas
Sedeh, Omid Sharifi
Loreto, Renan P.
Lehtinen, Janne S.
Xu, Mingchi
Cotten, Armel A.
Tarascio, Aldo
Müller, Peter
Yurttagül, Nikolai
Lehtisyrjä, Lassi
Grönberg, Leif
Scheller, Christian P.
Prance, Jonathan R.
Thompson, Michael D.
Haley, Richard P.
Prunnila, Mika
Zumbühl, Dominik M.
contents Tunnel junctions are one of the key elements of chip-scale microsystems serving various technologies from classical microelectronics to quantum information. Aluminium and its oxide (AlOx) have dominated cryogenic tunnel junction technology for decades due to the high quality of AlOx barriers and Al superconducting properties below 1.2 K. However, many applications require non-superconducting junctions, either standalone or in combination with superconducting technology, motivating efforts to suppress Al superconductivity through magnetic fields, doping, or proximity effects -- approaches that so far suffered from integration compatibility and scalability issues. Here, we present a CMOS-compatible normal-metal tunnel junction technology based on TiW alloy and AlOx barriers. We demonstrate wafer-scale fabrication of TiW/Al-AlOx/TiW junctions and validate their performance in Coulomb blockade thermometers operating down to 20 mK, confirming robust normal-state behavior. This TiW-based architecture offers a scalable solution for non-superconducting tunnel junctions across a broad temperature range, enabling integration into advanced cryogenic, quantum and nanoelectronic chip-level systems.
format Preprint
id arxiv_https___arxiv_org_abs_2602_14637
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle A scalable non-superconducting tunnel junction technology
Luomahaara, Juho
Razas, Kristupas
Sedeh, Omid Sharifi
Loreto, Renan P.
Lehtinen, Janne S.
Xu, Mingchi
Cotten, Armel A.
Tarascio, Aldo
Müller, Peter
Yurttagül, Nikolai
Lehtisyrjä, Lassi
Grönberg, Leif
Scheller, Christian P.
Prance, Jonathan R.
Thompson, Michael D.
Haley, Richard P.
Prunnila, Mika
Zumbühl, Dominik M.
Mesoscale and Nanoscale Physics
Materials Science
Tunnel junctions are one of the key elements of chip-scale microsystems serving various technologies from classical microelectronics to quantum information. Aluminium and its oxide (AlOx) have dominated cryogenic tunnel junction technology for decades due to the high quality of AlOx barriers and Al superconducting properties below 1.2 K. However, many applications require non-superconducting junctions, either standalone or in combination with superconducting technology, motivating efforts to suppress Al superconductivity through magnetic fields, doping, or proximity effects -- approaches that so far suffered from integration compatibility and scalability issues. Here, we present a CMOS-compatible normal-metal tunnel junction technology based on TiW alloy and AlOx barriers. We demonstrate wafer-scale fabrication of TiW/Al-AlOx/TiW junctions and validate their performance in Coulomb blockade thermometers operating down to 20 mK, confirming robust normal-state behavior. This TiW-based architecture offers a scalable solution for non-superconducting tunnel junctions across a broad temperature range, enabling integration into advanced cryogenic, quantum and nanoelectronic chip-level systems.
title A scalable non-superconducting tunnel junction technology
topic Mesoscale and Nanoscale Physics
Materials Science
url https://arxiv.org/abs/2602.14637