_version_ 1866918461639229440
author Das, Arghya Ranjan
Jiang, David
Kovach-Fuentes, Rachel
Kuang, Shiqi
Muñoz, Ana Sofía Calle
Shekar, Danush
Dickinson, Jennet
Di Guglielmo, Giuseppe
Gray, Lindsey
Liu, Mia
Mills, Corrinne
Neubauer, Mark S.
Abadjiev, Daniel
Badea, Anthony
Berry, Doug
DiPetrillo, Karri
Fahim, Farah
Gandrakota, Abhijith
Gupta, Harshul
Hirschauer, James
Howard, Eliza
Lipton, Ron
Maksimovic, Petar
Manganelli, Nick
Parpillon, Benjamin
Pearkes, Jannicke
Silvestre, Ricardo
Swartz, Morris
Syal, Chinar
Tran, Nhan
Trivedi, Amit
Ulmer, Keith
Wadud, Mohammad Abrar
Weiss, Benjamin
You, Eric
author_facet Das, Arghya Ranjan
Jiang, David
Kovach-Fuentes, Rachel
Kuang, Shiqi
Muñoz, Ana Sofía Calle
Shekar, Danush
Dickinson, Jennet
Di Guglielmo, Giuseppe
Gray, Lindsey
Liu, Mia
Mills, Corrinne
Neubauer, Mark S.
Abadjiev, Daniel
Badea, Anthony
Berry, Doug
DiPetrillo, Karri
Fahim, Farah
Gandrakota, Abhijith
Gupta, Harshul
Hirschauer, James
Howard, Eliza
Lipton, Ron
Maksimovic, Petar
Manganelli, Nick
Parpillon, Benjamin
Pearkes, Jannicke
Silvestre, Ricardo
Swartz, Morris
Syal, Chinar
Tran, Nhan
Trivedi, Amit
Ulmer, Keith
Wadud, Mohammad Abrar
Weiss, Benjamin
You, Eric
contents Modern scientific instruments operate under increasingly extreme constraints on bandwidth, latency, and power. Inference at the sensor edge determines experimental data collection efficiency by deciding which information to save for further analysis. Particle tracking detectors at the Large Hadron Collider exemplify this challenge: pixelated silicon sensors generate rich spatiotemporal ionization patterns, yet most of this information is discarded due to data-rate limitations. Concurrently, advancements in co-design tools provide rapid turn-around for incorporating machine learning into application-specific integrated circuits, motivating designs for particle detectors with new integrated technologies. We demonstrate that neural networks embedded in the front-end electronics can infer charged-particle kinematic parameters from a single silicon layer. We regress hit positions and incident angles with calibrated uncertainties, while satisfying stringent constraints on numerical precision, latency, and silicon area. Our results establish a path toward probabilistic inference directly at the edge, opening new opportunities for intelligent sensing in high-rate scientific instruments.
format Preprint
id arxiv_https___arxiv_org_abs_2602_15946
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle On-chip probabilistic inference for charged-particle tracking at the sensor edge
Das, Arghya Ranjan
Jiang, David
Kovach-Fuentes, Rachel
Kuang, Shiqi
Muñoz, Ana Sofía Calle
Shekar, Danush
Dickinson, Jennet
Di Guglielmo, Giuseppe
Gray, Lindsey
Liu, Mia
Mills, Corrinne
Neubauer, Mark S.
Abadjiev, Daniel
Badea, Anthony
Berry, Doug
DiPetrillo, Karri
Fahim, Farah
Gandrakota, Abhijith
Gupta, Harshul
Hirschauer, James
Howard, Eliza
Lipton, Ron
Maksimovic, Petar
Manganelli, Nick
Parpillon, Benjamin
Pearkes, Jannicke
Silvestre, Ricardo
Swartz, Morris
Syal, Chinar
Tran, Nhan
Trivedi, Amit
Ulmer, Keith
Wadud, Mohammad Abrar
Weiss, Benjamin
You, Eric
Instrumentation and Detectors
High Energy Physics - Experiment
Modern scientific instruments operate under increasingly extreme constraints on bandwidth, latency, and power. Inference at the sensor edge determines experimental data collection efficiency by deciding which information to save for further analysis. Particle tracking detectors at the Large Hadron Collider exemplify this challenge: pixelated silicon sensors generate rich spatiotemporal ionization patterns, yet most of this information is discarded due to data-rate limitations. Concurrently, advancements in co-design tools provide rapid turn-around for incorporating machine learning into application-specific integrated circuits, motivating designs for particle detectors with new integrated technologies. We demonstrate that neural networks embedded in the front-end electronics can infer charged-particle kinematic parameters from a single silicon layer. We regress hit positions and incident angles with calibrated uncertainties, while satisfying stringent constraints on numerical precision, latency, and silicon area. Our results establish a path toward probabilistic inference directly at the edge, opening new opportunities for intelligent sensing in high-rate scientific instruments.
title On-chip probabilistic inference for charged-particle tracking at the sensor edge
topic Instrumentation and Detectors
High Energy Physics - Experiment
url https://arxiv.org/abs/2602.15946