RHEED pattern classification by a convolutional neural network for the growth of chalcogenide thin films and nanostructures

Fuente: arXiv

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Bibliographic Details
Main Authors:	Muetzel, Nathan, Luu, Viet, Bey, Sara, Karim, Muhsin Abdul, Yoshimura, Kota, Liu, Xinyu, Gebran, Marwan, Assaf, Badih A.
Format:	Preprint
Published:	2026
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2602.18243