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A stochastic simulation of the dislocation-mediated etching of porous GaN distributed Bragg reflectors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Sokolinski, Piotr, Thornley, Ben, Xu, Zetai, Harris-Lee, Thom R., Kappers, Menno J., Oliver, Rachel A.
Format:	Preprint
Published:	2026
Subjects:	Materials Science
Online Access:	Acceder al recurso
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