Beam-Offset Thermoreflectance with Bayesian Optimization to Measure the Anisotropic Thermal Properties of Semiconductor Superlattices

Fuente: arXiv

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Bibliographic Details
Main Authors:	Chatterjee, A., Spitzer, N., Kruck, T., Song, P., Ludwig, A., Wieck, A. D., Ordonez-Miranda, J., Pawlak, M.
Format:	Preprint
Published:	2026
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2602.18840