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Beam-Offset Thermoreflectance with Bayesian Optimization to Measure the Anisotropic Thermal Properties of Semiconductor Superlattices

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Chatterjee, A., Spitzer, N., Kruck, T., Song, P., Ludwig, A., Wieck, A. D., Ordonez-Miranda, J., Pawlak, M.
Natura:	Preprint
Pubblicazione:	2026
Soggetti:	Materials Science
Accesso online:	Acceder al recurso
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