Robust Predictive Uncertainty and Double Descent in Contaminated Bayesian Random Features

Fuente: arXiv

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Bibliographic Details
Main Authors:	Caprio, Michele, Papagiannouli, Katerina, Chau, Siu Lun, Mukherjee, Sayan
Format:	Preprint
Published:	2026
Subjects:	Machine Learning Probability Statistics Theory
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2602.19126