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Bibliographic Details
Main Authors: Deshayes, Aurelia, Marchand, Régine
Format: Preprint
Published: 2026
Subjects:
Online Access:https://arxiv.org/abs/2602.19794
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Table of Contents:
  • The contact process on dynamic edges (CPDE) is a contact process evolving on a dynamic environment given by a dynamical percolation on the edges of Z d\,: each edge updates its state to open or closed with respective rates vp and v(1 -p). By coupling a well-chosen subset of once infected sites in the CPDE with a cluster of some supercritical percolation on the edges of Z d , we prove that, for every dimension d $\ge$ 2, we can find some slightly subcritical p < pc(d) such that for every update speed v > 0, the contact process with large enough infection rate can survive. This extends the result for dimension 1 proved by Linker and Remenik in [LR20].