Cita APA (7a ed.)

Lim, K. L., & Lin, J. (2026). Deep Clustering based Boundary-Decoder Net for Inter and Intra Layer Stress Prediction of Heterogeneous Integrated IC Chip.

Cita Chicago Style (17a ed.)

Lim, Kart Leong, y Ji Lin. Deep Clustering Based Boundary-Decoder Net for Inter and Intra Layer Stress Prediction of Heterogeneous Integrated IC Chip. 2026.

Cita MLA (9a ed.)

Lim, Kart Leong, y Ji Lin. Deep Clustering Based Boundary-Decoder Net for Inter and Intra Layer Stress Prediction of Heterogeneous Integrated IC Chip. 2026.