Easy to Learn, Yet Hard to Forget: Towards Robust Unlearning Under Bias

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kwon, JuneHyoung, Kim, MiHyeon, Lee, Eunju, Lee, Yoonji, Lee, Seunghoon, Kim, YoungBin
Format:	Preprint
Published:	2026
Subjects:	Machine Learning Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2602.21773