AMLRIS: Alignment-aware Masked Learning for Referring Image Segmentation

Fuente: arXiv
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Autores principales: Chen, Tongfei, Yang, Shuo, Yang, Yuguang, Yang, Linlin, Guo, Runtang, Li, Changbai, Long, He, Xie, Chunyu, Leng, Dawei, Zhang, Baochang
Formato: Preprint
Publicado: 2026
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author Chen, Tongfei
Yang, Shuo
Yang, Yuguang
Yang, Linlin
Guo, Runtang
Li, Changbai
Long, He
Xie, Chunyu
Leng, Dawei
Zhang, Baochang
author_facet Chen, Tongfei
Yang, Shuo
Yang, Yuguang
Yang, Linlin
Guo, Runtang
Li, Changbai
Long, He
Xie, Chunyu
Leng, Dawei
Zhang, Baochang
contents Referring Image Segmentation (RIS) aims to segment the object in an image uniquely referred to by a natural language expression. However, RIS training often contains hard-to-align and instance-specific visual signals; optimizing on such pixels injects misleading gradients and drives the model in the wrong direction. By explicitly estimating pixel-level vision-language alignment, the learner can suppress low-alignment regions, concentrate on reliable cues, and acquire more generalizable alignment features. In this paper, we propose Alignment-Aware Masked Learning (AML), a simple yet effective training strategy that quantifies region-referent alignment (PMME) and filters out unreliable pixels during optimization (AFM). Specifically, each sample first computes a similarity map between visual and textual features, and then masks out pixels falling below an adaptive similarity threshold, thereby excluding poorly aligned regions from the training process. AML does not require architectural changes and incurs no inference overhead, directing attention to the areas aligned with the textual description. Experiments on the RefCOCO (vanilla/+/g) datasets show that AML achieves state-of-the-art results across all 8 splits, and beyond improving RIS performance, AML also enhances the model's robustness to diverse descriptions and scenarios. Code is available at https://github.com/pipashu1/AMLRIS.
format Preprint
id arxiv_https___arxiv_org_abs_2602_22740
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle AMLRIS: Alignment-aware Masked Learning for Referring Image Segmentation
Chen, Tongfei
Yang, Shuo
Yang, Yuguang
Yang, Linlin
Guo, Runtang
Li, Changbai
Long, He
Xie, Chunyu
Leng, Dawei
Zhang, Baochang
Computer Vision and Pattern Recognition
Artificial Intelligence
Referring Image Segmentation (RIS) aims to segment the object in an image uniquely referred to by a natural language expression. However, RIS training often contains hard-to-align and instance-specific visual signals; optimizing on such pixels injects misleading gradients and drives the model in the wrong direction. By explicitly estimating pixel-level vision-language alignment, the learner can suppress low-alignment regions, concentrate on reliable cues, and acquire more generalizable alignment features. In this paper, we propose Alignment-Aware Masked Learning (AML), a simple yet effective training strategy that quantifies region-referent alignment (PMME) and filters out unreliable pixels during optimization (AFM). Specifically, each sample first computes a similarity map between visual and textual features, and then masks out pixels falling below an adaptive similarity threshold, thereby excluding poorly aligned regions from the training process. AML does not require architectural changes and incurs no inference overhead, directing attention to the areas aligned with the textual description. Experiments on the RefCOCO (vanilla/+/g) datasets show that AML achieves state-of-the-art results across all 8 splits, and beyond improving RIS performance, AML also enhances the model's robustness to diverse descriptions and scenarios. Code is available at https://github.com/pipashu1/AMLRIS.
title AMLRIS: Alignment-aware Masked Learning for Referring Image Segmentation
topic Computer Vision and Pattern Recognition
Artificial Intelligence
url https://arxiv.org/abs/2602.22740