Dixson, R. G., Pintar, A. L., Kline, R. J., Germer, T. A., Liddle, J. A., Villarrubia, J. S., & Stavis, S. M. (2026). Titanic overconfidence -- dark uncertainty can sink hybrid metrology for semiconductor manufacturing.
Style de citation Chicago (17e éd.)Dixson, Ronald G., Adam L. Pintar, R. Joseph Kline, Thomas A. Germer, J. Alexander Liddle, John S. Villarrubia, et Samuel M. Stavis. Titanic Overconfidence -- Dark Uncertainty Can Sink Hybrid Metrology for Semiconductor Manufacturing. 2026.
Style de citation MLA (9e éd.)Dixson, Ronald G., et al. Titanic Overconfidence -- Dark Uncertainty Can Sink Hybrid Metrology for Semiconductor Manufacturing. 2026.
Attention : ces citations peuvent ne pas être correctes à 100%.