APA (7th ed.) Citation

Dixson, R. G., Pintar, A. L., Kline, R. J., Germer, T. A., Liddle, J. A., Villarrubia, J. S., & Stavis, S. M. (2026). Titanic overconfidence -- dark uncertainty can sink hybrid metrology for semiconductor manufacturing.

Chicago Style (17th ed.) Citation

Dixson, Ronald G., Adam L. Pintar, R. Joseph Kline, Thomas A. Germer, J. Alexander Liddle, John S. Villarrubia, and Samuel M. Stavis. Titanic Overconfidence -- Dark Uncertainty Can Sink Hybrid Metrology for Semiconductor Manufacturing. 2026.

MLA (9th ed.) Citation

Dixson, Ronald G., et al. Titanic Overconfidence -- Dark Uncertainty Can Sink Hybrid Metrology for Semiconductor Manufacturing. 2026.