Micrometer-scale displacement and thickness sensing using a single terahertz resonant-tunneling diode

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yi, Li, Ito, Shota, Tang, Chao, Nishida, Yousuke, Terumoto, Koji, Maeda, Toshihisa, Inose, Yuta, Fujita, Masayuki
Format:	Preprint
Published:	2026
Subjects:	Optics Hardware Architecture
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2602.23621