Interfacial properties of MoS2 thin films grown on functional substrates

Fuente: arXiv
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Autores principales: Rehman, Hafiz Sami Ur, Coppola, Nunzia, Galdi, Alice, Chaluvadi, Sandeep Kumar, Chalil, Shyni Punathum, Orgiani, Pasquale, Passuti, Sara, Ciancio, Regina, Barone, Paolo, Maritato, Luigi, Aruta, Carmela
Formato: Preprint
Publicado: 2026
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author Rehman, Hafiz Sami Ur
Coppola, Nunzia
Galdi, Alice
Chaluvadi, Sandeep Kumar
Chalil, Shyni Punathum
Orgiani, Pasquale
Passuti, Sara
Ciancio, Regina
Barone, Paolo
Maritato, Luigi
Aruta, Carmela
author_facet Rehman, Hafiz Sami Ur
Coppola, Nunzia
Galdi, Alice
Chaluvadi, Sandeep Kumar
Chalil, Shyni Punathum
Orgiani, Pasquale
Passuti, Sara
Ciancio, Regina
Barone, Paolo
Maritato, Luigi
Aruta, Carmela
contents Interface chemistry and defect formation in MoS2 thin films grown on single crystal substrates critically determine the electronic structure of MoS2 and thus can strongly modify material functionality relevant for many applications, including electronics, optoelectronics, and energy related catalysis. We investigate MoS2 grown on three technologically relevant substrates, namely SrTiO3(111), c-axis Al2O3(0001) and 6H-SiC(0001). Experimental investigations by temperature dependent resistivity, photoemission spectroscopy and scanning transmission electron microscopy with coupled energy dispersive spectroscopy, with the support of theoretical calculation by Density Functional Theory, allow the identification of the substrate induced specific defects and their correlation with the electronic properties. Ti interdiffusion in SrTiO3/MoS2 generates donor like states near the Fermi level, leading to metallic transport. Al2O3/MoS2 exhibits a high density of sulfur related defects that introduce localized states and yield nearly temperature independent conductivity. SiC/MoS2 exhibits significant interface disorder resulting in a semiconducting temperature dependent resistivity, yet deviating from the ideal bulk like behavior. These results demonstrate how substrate choice governs defect formation and ultimately dominates the electronic behavior of MoS2 thin films, making the control of film substrate interactions essential for the engineering of new functional devices.
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id arxiv_https___arxiv_org_abs_2603_00271
institution arXiv
publishDate 2026
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spellingShingle Interfacial properties of MoS2 thin films grown on functional substrates
Rehman, Hafiz Sami Ur
Coppola, Nunzia
Galdi, Alice
Chaluvadi, Sandeep Kumar
Chalil, Shyni Punathum
Orgiani, Pasquale
Passuti, Sara
Ciancio, Regina
Barone, Paolo
Maritato, Luigi
Aruta, Carmela
Materials Science
Interface chemistry and defect formation in MoS2 thin films grown on single crystal substrates critically determine the electronic structure of MoS2 and thus can strongly modify material functionality relevant for many applications, including electronics, optoelectronics, and energy related catalysis. We investigate MoS2 grown on three technologically relevant substrates, namely SrTiO3(111), c-axis Al2O3(0001) and 6H-SiC(0001). Experimental investigations by temperature dependent resistivity, photoemission spectroscopy and scanning transmission electron microscopy with coupled energy dispersive spectroscopy, with the support of theoretical calculation by Density Functional Theory, allow the identification of the substrate induced specific defects and their correlation with the electronic properties. Ti interdiffusion in SrTiO3/MoS2 generates donor like states near the Fermi level, leading to metallic transport. Al2O3/MoS2 exhibits a high density of sulfur related defects that introduce localized states and yield nearly temperature independent conductivity. SiC/MoS2 exhibits significant interface disorder resulting in a semiconducting temperature dependent resistivity, yet deviating from the ideal bulk like behavior. These results demonstrate how substrate choice governs defect formation and ultimately dominates the electronic behavior of MoS2 thin films, making the control of film substrate interactions essential for the engineering of new functional devices.
title Interfacial properties of MoS2 thin films grown on functional substrates
topic Materials Science
url https://arxiv.org/abs/2603.00271