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| Format: | Preprint |
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2026
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| Online-Zugang: | https://arxiv.org/abs/2603.01364 |
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| author | Corbae, Paul Abelson, Alex Srivastava, Shivani Lee, Heemin Huang, Bevin Lee, Lyrik R-J Rash, Davis B. Kuo, Cheng-Tai Lu, Donghui Pendharkar, Mihir Alegria, Loren D. Li, Tian T. Ray, Keith G. Harvey, Shannon P. Mehta, Apurva Schuster, David I. Lordi, Vincenzo Welander, Paul B. Lee, Jun-Sik |
| author_facet | Corbae, Paul Abelson, Alex Srivastava, Shivani Lee, Heemin Huang, Bevin Lee, Lyrik R-J Rash, Davis B. Kuo, Cheng-Tai Lu, Donghui Pendharkar, Mihir Alegria, Loren D. Li, Tian T. Ray, Keith G. Harvey, Shannon P. Mehta, Apurva Schuster, David I. Lordi, Vincenzo Welander, Paul B. Lee, Jun-Sik |
| contents | Decoherence remains a critical obstacle to achieving high-fidelity, scalable superconducting qubits, with the tunnel barrier of Josephson junctions a key source of loss. Here we apply resonant X-ray reflectivity to non-destructively probe the electronic structure of buried layers in Al/AlO$_x$/Al Josephson junctions. At the Al $K$-edge, energy-dependent modulations in the reflectivity maps enable Kramers-Kronig-constrained extraction of the layer-resolved atomic scattering factors. The analysis reveals that the barrier coordination evolves from more tetrahedral toward predominantly octahedral character with increasing oxidation pressure. At the interfaces, the lower metal-oxide boundary is comparatively under-coordinated and disordered relative to the upper interface. Comparison with simulated X-ray absorption spectra identifies the dominant coordination motifs within the oxide and its interfaces, providing depth-resolved structural insight that constrains microscopic models of two-level system formation. These results link growth conditions, local coordination environments, and junction electronic properties, demonstrating resonant X-ray reflectivity as a powerful tool for probing the microscopic materials properties of Josephson junctions and providing a materials-level framework for mitigating decoherence in superconducting qubits. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2603_01364 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Probing Coordination Environments in Buried Oxides of Aluminum Josephson Junctions by Resonant X-ray Reflectivity Corbae, Paul Abelson, Alex Srivastava, Shivani Lee, Heemin Huang, Bevin Lee, Lyrik R-J Rash, Davis B. Kuo, Cheng-Tai Lu, Donghui Pendharkar, Mihir Alegria, Loren D. Li, Tian T. Ray, Keith G. Harvey, Shannon P. Mehta, Apurva Schuster, David I. Lordi, Vincenzo Welander, Paul B. Lee, Jun-Sik Materials Science Decoherence remains a critical obstacle to achieving high-fidelity, scalable superconducting qubits, with the tunnel barrier of Josephson junctions a key source of loss. Here we apply resonant X-ray reflectivity to non-destructively probe the electronic structure of buried layers in Al/AlO$_x$/Al Josephson junctions. At the Al $K$-edge, energy-dependent modulations in the reflectivity maps enable Kramers-Kronig-constrained extraction of the layer-resolved atomic scattering factors. The analysis reveals that the barrier coordination evolves from more tetrahedral toward predominantly octahedral character with increasing oxidation pressure. At the interfaces, the lower metal-oxide boundary is comparatively under-coordinated and disordered relative to the upper interface. Comparison with simulated X-ray absorption spectra identifies the dominant coordination motifs within the oxide and its interfaces, providing depth-resolved structural insight that constrains microscopic models of two-level system formation. These results link growth conditions, local coordination environments, and junction electronic properties, demonstrating resonant X-ray reflectivity as a powerful tool for probing the microscopic materials properties of Josephson junctions and providing a materials-level framework for mitigating decoherence in superconducting qubits. |
| title | Probing Coordination Environments in Buried Oxides of Aluminum Josephson Junctions by Resonant X-ray Reflectivity |
| topic | Materials Science |
| url | https://arxiv.org/abs/2603.01364 |