Sugimoto, T., Ichii, T., Kanai, T., Yoshizawa, R., Takahashi, S., Sakurai, A., . . . Chengxiang, J. (2026). Plasmonic- and Electronic-Enhancement-Free Coherent Raman Detection of Ångström-Scale Molecular Layers at Metal Interfaces.
Chicago Style (17th ed.) CitationSugimoto, Toshiki, Tomoaki Ichii, Tsuneto Kanai, Ryu Yoshizawa, Shota Takahashi, Atsunori Sakurai, Keisuke Seto, and Jin Chengxiang. Plasmonic- and Electronic-Enhancement-Free Coherent Raman Detection of Ångström-Scale Molecular Layers at Metal Interfaces. 2026.
MLA (9th ed.) CitationSugimoto, Toshiki, et al. Plasmonic- and Electronic-Enhancement-Free Coherent Raman Detection of Ångström-Scale Molecular Layers at Metal Interfaces. 2026.
Warning: These citations may not always be 100% accurate.