When Small Variations Become Big Failures: Reliability Challenges in Compute-in-Memory Neural Accelerators

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Qin, Yifan, Zheng, Jiahao, Yan, Zheyu, Wen, Wujie, Hu, Xiaobo Sharon, Shi, Yiyu
Format:	Preprint
Published:	2026
Subjects:	Machine Learning Hardware Architecture
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2603.03491