Demonstration of robust chiral edge transport in Chern insulator MnBi2Te4 devices with engineered geometric defects

Fuente: arXiv

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Bibliographic Details
Main Authors:	Wang, Pinyuan, Ge, Jun, Luo, Jiawei, Liu, Xiaoqi, Fei, Fucong, Song, Fengqi, Wang, Jian
Format:	Preprint
Published:	2026
Subjects:	Mesoscale and Nanoscale Physics Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.03927