_version_ 1866914368593068032
author Ohsumi, Yuya
Hashimoto, Daisuke
Horii, Yasuyuki
Aoki, Takumi
Asada, Haruka
Hashizume, Kazumasa
Inaguma, Hayato
Ishino, Masaya
Kikuchi, Miyuki
Kondo, Shota
Maeno, Reita
Makita, Airu
Minakawa, Masaki
Mitsumori, Yuki
Nabeyama, Yuki
Nagasaka, Ren
Nakajima, Takumi
Narukawa, Yoshifumi
Ochi, Atsuhiko
Okumura, Yasuyuki
Sasaki, Osamu
Tanaka, Aoto
Taniike, Akira
Tomoto, Makoto
Wada, Arisa
Yamashita, Erika
author_facet Ohsumi, Yuya
Hashimoto, Daisuke
Horii, Yasuyuki
Aoki, Takumi
Asada, Haruka
Hashizume, Kazumasa
Inaguma, Hayato
Ishino, Masaya
Kikuchi, Miyuki
Kondo, Shota
Maeno, Reita
Makita, Airu
Minakawa, Masaki
Mitsumori, Yuki
Nabeyama, Yuki
Nagasaka, Ren
Nakajima, Takumi
Narukawa, Yoshifumi
Ochi, Atsuhiko
Okumura, Yasuyuki
Sasaki, Osamu
Tanaka, Aoto
Taniike, Akira
Tomoto, Makoto
Wada, Arisa
Yamashita, Erika
contents This paper evaluates the radiation tolerance of commercial off-the-shelf (COTS) electronics components for use in the Thin Gap Chamber (TGC) frontend electronics of the ATLAS experiment at the High-Luminosity LHC (HL-LHC). The ATLAS experiment has accumulated more than 450 fb^-1 of data as of 2025. Its luminosity upgrade, the HL-LHC scheduled to begin operation in 2030, will deliver 3000-4000 fb^-1 over ten years and lead to substantially higher radiation levels in detector electronics. The radiation levels for the TGC frontend electronics are estimated to be 4.1-7.3 Gy in terms of Total Ionizing Dose (TID) and 1.1-2.2 x 10^11 n_1MeV cm^-2 in terms of Non-Ionizing Energy Loss (NIEL). To evaluate component suitability under these conditions, TID tests were conducted using Cobalt-60 gamma rays at Nagoya University, and NIEL tests were performed with the Tandem Accelerator at Kobe University. Various COTS components, including SFP+ optical transceivers, clock jitter cleaners, optical fibers, voltage references, operational amplifiers, analog-to-digital converters, digital-to-analog converters, SD cards, flash memories, and low-dropout regulators, were tested and evaluated against the required radiation levels. The results demonstrate that all evaluated components meet the TID and NIEL tolerance requirements for application in the TGC frontend electronics at the HL-LHC.
format Preprint
id arxiv_https___arxiv_org_abs_2603_04129
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Irradiation Studies of TGC Electronics Components for the ATLAS Experiment at High-Luminosity LHC
Ohsumi, Yuya
Hashimoto, Daisuke
Horii, Yasuyuki
Aoki, Takumi
Asada, Haruka
Hashizume, Kazumasa
Inaguma, Hayato
Ishino, Masaya
Kikuchi, Miyuki
Kondo, Shota
Maeno, Reita
Makita, Airu
Minakawa, Masaki
Mitsumori, Yuki
Nabeyama, Yuki
Nagasaka, Ren
Nakajima, Takumi
Narukawa, Yoshifumi
Ochi, Atsuhiko
Okumura, Yasuyuki
Sasaki, Osamu
Tanaka, Aoto
Taniike, Akira
Tomoto, Makoto
Wada, Arisa
Yamashita, Erika
Instrumentation and Detectors
High Energy Physics - Experiment
This paper evaluates the radiation tolerance of commercial off-the-shelf (COTS) electronics components for use in the Thin Gap Chamber (TGC) frontend electronics of the ATLAS experiment at the High-Luminosity LHC (HL-LHC). The ATLAS experiment has accumulated more than 450 fb^-1 of data as of 2025. Its luminosity upgrade, the HL-LHC scheduled to begin operation in 2030, will deliver 3000-4000 fb^-1 over ten years and lead to substantially higher radiation levels in detector electronics. The radiation levels for the TGC frontend electronics are estimated to be 4.1-7.3 Gy in terms of Total Ionizing Dose (TID) and 1.1-2.2 x 10^11 n_1MeV cm^-2 in terms of Non-Ionizing Energy Loss (NIEL). To evaluate component suitability under these conditions, TID tests were conducted using Cobalt-60 gamma rays at Nagoya University, and NIEL tests were performed with the Tandem Accelerator at Kobe University. Various COTS components, including SFP+ optical transceivers, clock jitter cleaners, optical fibers, voltage references, operational amplifiers, analog-to-digital converters, digital-to-analog converters, SD cards, flash memories, and low-dropout regulators, were tested and evaluated against the required radiation levels. The results demonstrate that all evaluated components meet the TID and NIEL tolerance requirements for application in the TGC frontend electronics at the HL-LHC.
title Irradiation Studies of TGC Electronics Components for the ATLAS Experiment at High-Luminosity LHC
topic Instrumentation and Detectors
High Energy Physics - Experiment
url https://arxiv.org/abs/2603.04129